Invited Speaker---Prof. Yoshinobu Higami


Graduate School of Science and Engineering, Ehime University, Japan

Biography: Yoshinobu Higami received his B.E., M.E., and D.E. degrees from Osaka University in 1991, 1993 and 1996, respectively. Currently he is a professor at Graduate School of Science and Engineering, Ehime University. In 1998 and 2006, he was also an honorary fellow at University of Wisconsin-Madison, U.S.A. He received the IEICE Best Paper Award in 2005 and 2012. His research interests include test generation, design for testability and fault diagnosis of logic circuits. He is a senior member of the IEEE and a member of IEICE and IPSJ.

Speech Title: Adaptive Field Diagnosis for Reducing Computing time
Abstract: Some computer systems need extremely high reliability, such as transportation systems, medical systems, financial systems and so on. One of the promising ways is online test or field test, by which systems are tested while they are running or in the idle mode. If a fault is detected by the field testing, the system immediately transfers into a safety mode. Fault diagnosis as well as fault detection is meaningful in the field testing. If a faulty site is identified by the fault diagnosis, the system can be operated without activating the fault. One of the requirements for field diagnosis is to minimize the computing time, because field testing is executed during an idle mode or a start-up mode. In this research, we propose a field diagnosis method aiming at the computing time. In order to reduce the computing time, two key factors are investigated: the number of applied test patterns and the number of bits of compacted output responses. Efficient methods for reducing the above numbers are proposed. The effectiveness of the proposed method are confirmed through experiments for benchmark circuits.